WebbThe M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.IONTOF homepage: www.iontof.comInstrument brochure: … WebbThe M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New …
IONTOF - TOF-SIMS (time of flight secondary ion mass …
WebbFounded as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation. Webb18 jan. 2024 · IONTOF M6 ToF-SIMS Time of Flight – Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface sensitive analytical technique that provides detailed elemental, … chiropractic first winterset ia
Characterisation of Sr2+ mobility in osteoporotic rat bone marrow …
WebbThe M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New … WebbThe M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New … Webba) M6 Hybrid SIMS (IONTOF GmbH, Muenster, Germany) Table S2. Parameters for ToF-SIMS delayed extraction imaging of Sr2+ diffusion into rat fat sections (Figure 8, Figure S3) obtained in positive ion mode with M6 Hybrid SIMS (IONTOF GmbH, Muenster, Germany). Figure 8 (A-D) 8 (E-H) S3 Analysis options Cycle Time 130 µs 130 µs 150 µs graphic process unit